Seminar: Concept for a reflectometer using focusing guides

We are working on a concept for a reflectometer where elliptic guides
are used to map the divergent beam from a small (virtual) source to the
sample. For small samples, i.e. below 1 cm^2 area, this leads to about the same intensity as a conventional set up. But the focusing has various advantages:
Over-illumination of the sample environment is (almost) suppressed.
It s possible to use a wide convergent beam for high-intensity specular measurements.
The beam can be tuned between almost parallel and wide, and strongly focused on a beam spot in the sub-mm range.
The small beam cross section close to the focal points allows for a convenient beam manipulation by choppers, polarisers or band-pass filters.

A simplified version of the proposed instrument is already realised as an option on the TOF reflectometer AMOR, a prototype with the full functionality is under construction.

Datum

12.03.2012

Zeit

14:45–15:45

Ort

Physics HS3

Garching, Garching, Deutschland

Speaker

Dr. J. Stahn, Paul Scherrer Institut, Villigen, CH

Veranstalter

TUM/FRM II

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